Title :
A method to reduce the phase noise in bipolar transistor circuits
Author :
Takagi, K. ; Serikawa, S. ; Doi, T.
Author_Institution :
Dept. of Electron., Kyushu Inst. of Technol., Kitakyushu, Japan
fDate :
11/1/1998 12:00:00 AM
Abstract :
We measured the phase and amplitude noises and their correlation coefficient in the collector current. The noise-generating mechanism due to the diffusion coefficient fluctuation in the base is discussed, using the distributed constant circuit model. A possible noise reduction method is proposed, using the correlation between the phase and amplitude noises
Keywords :
1/f noise; bipolar transistor circuits; circuit noise; diffusion; equivalent circuits; fluctuations; interference suppression; network analysis; phase noise; semiconductor device noise; amplitude noise; bipolar transistor circuits; collector current; correlation coefficient; diffusion coefficient fluctuation; distributed constant circuit model; noise analysis; noise-generating mechanism; phase noise reduction; Bipolar transistor circuits; Circuit noise; Fluctuations; Low-frequency noise; Noise level; Noise measurement; Noise reduction; Phase measurement; Phase noise; Semiconductor device noise;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on