• DocumentCode
    1449295
  • Title

    Observation of Barkhausen noise in a 20×20 μm permalloy thin film square dot

  • Author

    Callegaro, Luca ; Puppin, Ezio ; Ricci, Simona

  • Author_Institution
    Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
  • Volume
    36
  • Issue
    5
  • fYear
    2000
  • fDate
    9/1/2000 12:00:00 AM
  • Firstpage
    3087
  • Lastpage
    3089
  • Abstract
    Barkhausen jumps in the magnetic hysteresis loop of a single permalloy thin film square dot of 20×20 μm in size and 80 nm thick have been observed, for the first time, with a magneto-optical ellipsometer which is capable of recording a complete loop in seconds and in a single sweep of applied field. About 6000 loops have been measured and separately recorded: each loop is different from the others. The statistical properties of the Barkhausen jumps are presented and discussed
  • Keywords
    Barkhausen effect; Kerr magneto-optical effect; Permalloy; ferromagnetic materials; magnetic domains; magnetic hysteresis; magnetic thin films; 20 mum; 80 nm; Barkhausen noise; Ni80Fe20; magnetic hysteresis loop; magneto-optical ellipsometer; permalloy thin film square dot; Magnetic field measurement; Magnetic hysteresis; Magnetic materials; Magnetization; Magnetooptic recording; Optical films; Optical sensors; Size measurement; Transistors; US Department of Transportation;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.908690
  • Filename
    908690