DocumentCode :
1449295
Title :
Observation of Barkhausen noise in a 20×20 μm permalloy thin film square dot
Author :
Callegaro, Luca ; Puppin, Ezio ; Ricci, Simona
Author_Institution :
Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
Volume :
36
Issue :
5
fYear :
2000
fDate :
9/1/2000 12:00:00 AM
Firstpage :
3087
Lastpage :
3089
Abstract :
Barkhausen jumps in the magnetic hysteresis loop of a single permalloy thin film square dot of 20×20 μm in size and 80 nm thick have been observed, for the first time, with a magneto-optical ellipsometer which is capable of recording a complete loop in seconds and in a single sweep of applied field. About 6000 loops have been measured and separately recorded: each loop is different from the others. The statistical properties of the Barkhausen jumps are presented and discussed
Keywords :
Barkhausen effect; Kerr magneto-optical effect; Permalloy; ferromagnetic materials; magnetic domains; magnetic hysteresis; magnetic thin films; 20 mum; 80 nm; Barkhausen noise; Ni80Fe20; magnetic hysteresis loop; magneto-optical ellipsometer; permalloy thin film square dot; Magnetic field measurement; Magnetic hysteresis; Magnetic materials; Magnetization; Magnetooptic recording; Optical films; Optical sensors; Size measurement; Transistors; US Department of Transportation;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.908690
Filename :
908690
Link To Document :
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