Title :
Stochastic Analysis of Switched-Capacitor Circuits for Sampled Data Converters
Author :
Maffezzoni, Paolo
Author_Institution :
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
fDate :
3/1/2012 12:00:00 AM
Abstract :
This paper describes an original simulation-based method to derive the stochastic properties of the output noise of switched-capacitor circuits which are used in sampled-data converters. The method relies on a linear time-varying approximation of the large-signal transient response of the switched circuits. It is shown how switched-capacitor-circuit noise and quantization noise, due to the presence of harsh comparators, can be analyzed in a unified frame where the data converter is modeled as a discrete-time system.
Keywords :
CMOS integrated circuits; discrete time systems; integrated circuit noise; sampled data circuits; stochastic processes; switched capacitor filters; transient response; discrete-time system; harsh comparator; large-signal transient response; linear time-varying approximation; quantization noise; sampled data converter; simulation-based method; stochastic analysis; switched-capacitor-circuit noise; Computational modeling; Integrated circuit modeling; Mathematical model; Noise; Stochastic processes; Switched capacitor circuits; Switches; Discrete-time systems; noise analysis; switched-capacitor circuits;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2011.2170570
