• DocumentCode
    1449513
  • Title

    Estimation of propagation delay considering short-circuit current for static CMOS gates

  • Author

    Hirata, Akio ; Onodera, Hidetoshi ; Tamura, Keiichi

  • Author_Institution
    Dept. of Commun. & Comput. Eng., Kyoto Univ., Japan
  • Volume
    45
  • Issue
    11
  • fYear
    1998
  • fDate
    11/1/1998 12:00:00 AM
  • Firstpage
    1194
  • Lastpage
    1198
  • Abstract
    We present a formula of propagation delay for static CMOS logic gates considering short-circuit current and current flowing through gate capacitance and using the nth power law MOSFET model which considers velocity saturation effects. The short circuit current is represented by a piecewise linear function, which enables detailed analysis of the transient behaviour of a CMOS inverter. We found that the error of our formulas for a CMOS inverter is less than 8% from circuit simulation in most cases of our experiments. We also applied these formulas to logic gates made up of series-parallel connected MOSFETs by replacing the series-connected MOSFETs with an equivalent MOSFET. The influence of short-circuit power on delay, which is explicitly modeled in our formula, is numerically demonstrated such that the influence becomes large with slow input transition and small output load capacitance
  • Keywords
    CMOS logic circuits; MOSFET; capacitance; delays; logic gates; piecewise linear techniques; transient analysis; gate capacitance; nth power law MOSFET model; output load capacitance; piecewise linear function; propagation delay; series-parallel connected MOSFETs; short-circuit current; short-circuit power; slow input transition; static CMOS gates; transient behaviour; velocity saturation effects; CMOS logic circuits; Capacitance; Delay estimation; Inverters; Logic gates; MOSFET circuits; Power MOSFET; Propagation delay; Semiconductor device modeling; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7122
  • Type

    jour

  • DOI
    10.1109/81.735442
  • Filename
    735442