DocumentCode :
1449532
Title :
π-heterostructure field effect transistors for VLSI applications
Author :
Lee, Kwyro ; Shur, Michael
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
Volume :
37
Issue :
8
fYear :
1990
fDate :
8/1/1990 12:00:00 AM
Firstpage :
1810
Lastpage :
1820
Abstract :
A quantum-well heterostructure field effect transistor (HFET) with a p+ gate and fairly heavily doped p-type buffer is described. This device is called a π-HFET, meaning p-type insulated gate HFET. The effective barrier height in a π-HFET is considerably larger than in other compound semiconductor FETs, and the gate current at maximum gate voltage swing can be made negligible, even at room temperature. Based on the tradeoff between the noise margin and speed, 0.7 and 1.5 V are proposed as the minimum power supply voltages for the direct-coupled FET logic at 77 and 300 K, respectively. Calculations demonstrate that this π-HFET technology can meet all requirements for VLSI applications, and that high electron velocity and mobility in π-HFETs lead to an increase in speed of output drivers by a factor of four at 77 K and a factor of 10 at 300 K (compared to Si NMOS which is faster than CMOS). The full advantages of π-HFET technology can be realized only on a submicrometer scale, where source and drain series resistances play a dominant role in determining the noise margin
Keywords :
VLSI; field effect integrated circuits; high electron mobility transistors; integrated circuit technology; integrated logic circuits; semiconductor technology; π-HFET; 300 K; 77 K; PIHEMT; VLSI; compound semiconductor FETs; direct-coupled FET logic; drain series resistances; effective barrier height; electron mobility; gate current; heavily doped p-type buffer; heterostructure field effect transistor; high electron velocity; noise margin; p-type insulated gate HFET; p+ gate; power supply voltages; quantum well HEMT; room temperature; speed; submicrometer scale; CMOS technology; FETs; HEMTs; Insulation; MODFETs; Quantum well devices; Semiconductor device noise; Temperature; Very large scale integration; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.57131
Filename :
57131
Link To Document :
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