• DocumentCode
    1449575
  • Title

    Self-aligned micromachining process for large-scale, free-space optical cross-connects

  • Author

    Helin, Philippe ; Mita, Makoto ; Bourouina, Tarik ; Reyne, Gilbert ; Fujita, Hiroyuki

  • Author_Institution
    Tokyo Univ., Japan
  • Volume
    18
  • Issue
    12
  • fYear
    2000
  • fDate
    12/1/2000 12:00:00 AM
  • Firstpage
    1785
  • Lastpage
    1791
  • Abstract
    A new micromachining process for large-scale optical cross-connects is presented. It satisfies the high-accuracy optical alignment required for free-space optics. A self-aligned batch-process allowing the simultaneous fabrication of vertical mirrors and fiber guides is performed with only one-mask. This process is based on bulk micromachining of [100] silicon. A first demonstration is performed on a 2/spl times/2 elementary cell then, it is extended to the fabrication of larger mirror arrays. Promising performances such as insertion loss lower than 0.5 dB, sub-millisecond switching time (0.3 ms) and reliable operation (more than 20 million cycles) are demonstrated on a bypass switch. An improved fabrication process, leading to an increase of integration density is also presented. It is based on the combination of deep dry-etching and anisotropic wet-etching.
  • Keywords
    micro-optics; micromachining; mirrors; optical arrays; optical fabrication; optical interconnections; optical losses; reliability; 0.3 ms; 0.5 dB; Si; anisotropic wet-etching; deep dry-etching; fabrication process; free-space optics; high-accuracy optical alignment; insertion loss; large-scale free-space optical cross-connects; micromachining; mirror arrays; self-aligned batch-process; self-aligned micromachining process; vertical mirror; Geometrical optics; Large-scale systems; Micromachining; Mirrors; Optical crosstalk; Optical device fabrication; Optical interconnections; Optical scattering; Optical switches; Silicon;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.908730
  • Filename
    908730