DocumentCode
144961
Title
Discrete approach to electrical resistance tomography with applications to distributed network sensing
Author
Aguiar, Frederico M. ; Pipa, Daniel R. ; da Silva, Marco
Author_Institution
Grad. Sch. of Electr. Eng. & Comput. Sci., Fed. Univ. of Technol., Curitiba, Brazil
fYear
2014
fDate
17-20 Aug. 2014
Firstpage
1
Lastpage
4
Abstract
Most of electrical resistance tomography literature is aimed at biomedical application, where one wishes to estimate the conductivity distribution of some portion of human body in order to detect some health disorder. The solution to this problem often starts considering a continuous media, which requires subsequent discretization through finite element simulations or other sophisticated methods. In this paper, we propose an alternative and purely discrete approach. We pose the problem as a resistor grid, or network, of which only the peripheral elements are accessible for measurements. By injecting known electrical current externally, we want to estimate all the conductances of the network given only boundary voltage measurements. Since the relation between conductance values and voltage measurement is nonlinear, we present two solutions to the problem: one based on iterative linearization and another based on neural network, which solves the problem directly in the nonlinear domain. Finally, we present simulated experiments to demonstrate the viability of the proposed approach and highlight possible applications of the developed technique.
Keywords
distributed sensors; electric impedance imaging; iterative methods; linearisation techniques; neural nets; resistors; tomography; voltage measurement; biomedical application; boundary voltage measurements; conductance values; conductivity distribution; distributed network sensing; electrical current; electrical resistance tomography; finite element simulations; health disorder; human body; iterative linearization; neural network; resistor grid; Artificial neural networks; Image reconstruction; Impedance; Neurons; Resistors; Tomography; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Telecommunications Symposium (ITS), 2014 International
Conference_Location
Sao Paulo
Type
conf
DOI
10.1109/ITS.2014.6947988
Filename
6947988
Link To Document