DocumentCode :
1449834
Title :
An Autocalibrated All-Digital Temperature Sensor for On-Chip Thermal Monitoring
Author :
Chung, Ching-Che ; Yang, Cheng-Ruei
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Chung Cheng Univ., Minhsiung, Taiwan
Volume :
58
Issue :
2
fYear :
2011
Firstpage :
105
Lastpage :
109
Abstract :
This brief presents an autocalibrated all-digital temperature sensor circuit for use with on-chip thermal sensing applications. The proposed temperature sensor eliminates the need for two-temperature-point calibration in prior temperature sensors. Therefore, temperature sensor calibration efforts in high-volume production can be significantly reduced. The proposed design uses reference clock period information to perform self-calibration, and thus, effects of process variation can be removed. Subsequently, the accuracy of the proposed temperature sensor can be improved with very small area cost and low power consumption. The temperature sensor is implemented with a standard performance 65-nm complementary metal-oxide-semiconductor technology. The core area is 0.01 mm2, and the power consumption of the proposed circuit is 150 μW with a 1-V supply. Since the proposed temperature sensor can be easily calibrated with a reference clock, the proposed design is very suitable for dynamic thermal management applications in a system-on-a-chip era.
Keywords :
calibration; temperature sensors; thermal management (packaging); autocalibrated all digital temperature sensor; clock period information; dynamic thermal management application; metal oxide semiconductor technology; on chip thermal monitoring; power 150 muW; power consumption; size 65 nm; temperature sensor calibration; voltage 1 V; CMOS integrated circuits; Calibration; Pulse generation; System-on-a-chip; Temperature measurement; Temperature sensors; Calibration; circuit reliability; delay circuits; delay lines; digital circuits; sensors;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2010.2104016
Filename :
5713241
Link To Document :
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