DocumentCode
1449873
Title
High-Frequency Behavior of Graphene-Based Interconnects—Part I: Impedance Modeling
Author
Sarkar, Deblina ; Xu, Chuan ; Li, Hong ; Banerjee, Kaustav
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of California - Santa Barbara, Santa Barbara, CA, USA
Volume
58
Issue
3
fYear
2011
fDate
3/1/2011 12:00:00 AM
Firstpage
843
Lastpage
852
Abstract
This paper presents the first detailed methodology for the accurate evaluation of high-frequency impedance of graphene-based structures relevant to on-chip interconnect and inductor applications. Going beyond the simplifying assumptions of Ohm´s law, the effects of electric-field variation within a mean free path and current dependency on the nonlocal electric-field are taken into account to accurately capture the high-frequency behavior of graphene ribbons (GRs). At the same time, a simplified approach that may be adopted at lower frequencies is also explained. Starting from the basic Boltzmann equation and combining with the unique dispersion relation for graphene in its hexagonal Brillouin zone, the current density across the GR structure is derived. First, a semi-infinite slab of GR is analyzed using the theory of Fourier integrals, which is followed by the development of a rigorous methodology for practical finite structures based on a self-consistent numerical calculation of the derived current density using the Green´s function approach.
Keywords
Boltzmann equation; Brillouin zones; Green´s function methods; VLSI; electric fields; graphene; integrated circuit interconnections; Boltzmann equation; Green function; Ohm law; current dependency; electric-field variation; graphene ribbons; graphene-based interconnects; hexagonal Brillouin zone; high-frequency impedance; impedance modeling; mean free path; nonlocal electric-field; on-chip interconnect; Conductivity; Copper; Current density; Distribution functions; Impedance; Scattering; Skin; Anomalous skin effect (ASE); carbon nanomaterials; graphene; high frequency; impedance; intercalation doping; interconnects; skin effect; specularity;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2010.2102031
Filename
5713247
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