DocumentCode :
1450012
Title :
Codes for Asymmetric Limited-Magnitude Errors With Application to Multilevel Flash Memories
Author :
Cassuto, Yuval ; Schwartz, Moshe ; Bohossian, Vasken ; Bruck, Jehoshua
Author_Institution :
Hitachi Global Storage Technol., San Jose, CA, USA
Volume :
56
Issue :
4
fYear :
2010
fDate :
4/1/2010 12:00:00 AM
Firstpage :
1582
Lastpage :
1595
Abstract :
Several physical effects that limit the reliability and performance of multilevel flash memories induce errors that have low magnitudes and are dominantly asymmetric. This paper studies block codes for asymmetric limited-magnitude errors over q-ary channels. We propose code constructions and bounds for such channels when the number of errors is bounded by t and the error magnitudes are bounded by l. The constructions utilize known codes for symmetric errors, over small alphabets, to protect large-alphabet symbols from asymmetric limited-magnitude errors. The encoding and decoding of these codes are performed over the small alphabet whose size depends only on the maximum error magnitude and is independent of the alphabet size of the outer code. Moreover, the size of the codes is shown to exceed the sizes of known codes (for related error models), and asymptotic rate-optimality results are proved. Extensions of the construction are proposed to accommodate variations on the error model and to include systematic codes as a benefit to practical implementation.
Keywords :
block codes; error correction codes; flash memories; reliability; asymmetric limited magnitude errors; block codes; decoding; encoding; error correcting codes; multilevel flash memories; systematic codes; Block codes; Decoding; Error correction codes; Flash memory; Helium; Information theory; Nonvolatile memory; Power system modeling; Protection; $q$-ary codes; Asymmetric limited-magnitude errors; error-correcting codes; flash memory codes; systematic codes;
fLanguage :
English
Journal_Title :
Information Theory, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9448
Type :
jour
DOI :
10.1109/TIT.2010.2040971
Filename :
5437412
Link To Document :
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