DocumentCode :
1450069
Title :
Reliability Assessment for Wireless Mesh Networks Under Probabilistic Region Failure Model
Author :
Liu, Jiajia ; Jiang, Xiaohong ; Nishiyama, Hiroki ; Kato, Nei
Author_Institution :
Grad. Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan
Volume :
60
Issue :
5
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
2253
Lastpage :
2264
Abstract :
Wireless networks in an open environment are exposed to various large region threats, e.g., natural disasters and malicious attacks. Available works with regard to region failures generally adopt a kind of “deterministic” failure models, which failed to reflect some key features of a real region failure. In this paper, we provide a more general “probabilistic” region failure model to capture the key features of a region failure and apply it for the reliability assessment of wireless mesh networks. To facilitate such an assessment, we develop a grid-partition-based scheme to estimate the expected flow capacity degradation from a random region failure. We then establish a theoretical framework to determine a suitable grid partition such that a specified estimation error requirement is satisfied. The grid partition technique is also useful for identifying the vulnerable zones of a network, which can guide network designers to initiate proper network protection against such failures. This paper helps us understand the network reliability under a region failure and facilitates the design and maintenance of future highly survivable wireless networks.
Keywords :
telecommunication network reliability; telecommunication security; wireless mesh networks; grid-partition-based scheme; malicious attacks; natural disasters; network protection; probabilistic region failure model; reliability assessment; survivable wireless networks; wireless mesh networks; Degradation; Estimation error; Probabilistic logic; Reliability; Wireless mesh networks; Wireless networks; Network reliability; region failure; wireless mesh networks;
fLanguage :
English
Journal_Title :
Vehicular Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9545
Type :
jour
DOI :
10.1109/TVT.2011.2114684
Filename :
5713274
Link To Document :
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