Title :
Modeling and limits of advanced HT-magnets
Author :
Schrefl, Thomas ; Fidler, Josef ; Scholz, Werner
Author_Institution :
Inst. of Appl. & Tech. Phys., Wien Univ. of Technol., Austria
fDate :
9/1/2000 12:00:00 AM
Abstract :
This paper combines microstructural investigations using transmission electron microscopy with micromagnetic finite element simulation of the magnetic domain wall pinning behavior of novel Sm(Co, Fe, Cu, Zr)7, 4-8, 0 permanent magnet materials applicable up to 550°C. A finite element method was used to simulate domain wall pinning in SmCo5/Sm2Co17 based permanent magnets. The finite element model was built-according to the cellular microstructure obtained from TEM investigations. The numerical results show a strong influence of the dimension of the cell boundary phase on the coercive field, which significantly increases with the extension of the 1:5/7-type cell boundary phase. The calculated values of the coercive field are in the range from 1000-2000 kA/m assuming a cell size varying from 80-160 nn. The difference of the magnetocrystalline anisotropy between cell boundary and cell interior phases is determined by the Cu-content of the magnet. Due to the lower Curie temperature of the Cu-containing cell boundary phase high coercive fields are obtained at elevated temperatures (>400°C)
Keywords :
cobalt alloys; coercive force; copper alloys; crystal microstructure; ferromagnetic materials; finite element analysis; iron alloys; magnetic anisotropy; magnetic domain walls; permanent magnets; samarium alloys; transmission electron microscopy; zirconium alloys; Cu-content; Curie temperature; Sm(Co,Fe,Cu,Zr) permanent magnet materials; SmCo17; SmCo5; SmCo5/Sm2Co17 based permanent magnets; SmCoFeCuZr; TEM; advanced HT-magnets; cell boundary phase; cell interior phases; cellular microstructure; coercive field; elevated temperatures; high temperature magnets; limits; magnetic domain wall pinning behavior; magnetocrystalline anisotropy; micromagnetic finite element simulation; microstructural investigations; modeling; transmission electron microscopy; Finite element methods; Magnetic anisotropy; Magnetic domain walls; Magnetic force microscopy; Magnetic materials; Micromagnetics; Permanent magnets; Perpendicular magnetic anisotropy; Temperature; Transmission electron microscopy;
Journal_Title :
Magnetics, IEEE Transactions on