• DocumentCode
    1450147
  • Title

    RF Joule Losses Analysis in Thin Film Noise Suppressor Estimated by 3-D Equivalent Circuit Network

  • Author

    Muroga, Sho ; Yamaguchi, Masahiro

  • Author_Institution
    Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
  • Volume
    45
  • Issue
    10
  • fYear
    2009
  • Firstpage
    4804
  • Lastpage
    4807
  • Abstract
    This paper discusses the Joule losses in a thin film noise suppressor based on 3-D equivalent circuit network analysis and 3-D full wave electromagnetic field simulation. The thin film and transmission line is divided into number of elements in a plane perpendicular to surface of thin film. Each element is represented by four resistances in length and width direction and capacitors between conductors. Joule loss is quantitatively calculated as a function of sheet resistance using equivalent circuit network analysis. From this result it is successful by shown the Joule loss in thin film is a function of sheet resistance, not the intrinsic resistivity of the thin film or thickness as previous analyses. It is also shown that the Joule loss in the thin film is determined by the two major factors; the eddy current and conduction current deviated from the signal line in the form of displacement current. This result shows that the proposed equivalent circuits well explain the mechanism of the Joule losses in thin film.
  • Keywords
    circuit noise; eddy currents; electric resistance; electrical resistivity; equivalent circuits; network analysers; thin film devices; transmission lines; 3-D equivalent circuit network analysis; 3-D full wave electromagnetic field simulation; RF Joule losses analysis; capacitors; conduction current; displacement current; eddy current; intrinsic resistivity; sheet resistance; thin film noise suppressor; thin film surface; transmission line; EMC; eddy current losses; electromagnetic noise suppressor; equivalent circuits; joule losses; sheet resistance; thin films;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2009.2022494
  • Filename
    5257154