• DocumentCode
    1450222
  • Title

    Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge

  • Author

    Rao, Wenjing ; Yang, Chengmo ; Karri, Ramesh ; Orailoglu, Alex

  • Volume
    44
  • Issue
    2
  • fYear
    2011
  • Firstpage
    46
  • Lastpage
    53
  • Abstract
    Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.
  • Keywords
    electronic engineering computing; low-power electronics; nanoelectronics; power aware computing; reliability; device density; future systems; nanoscale devices; reliability strategies; Nanoelectronics; Nanoscale devices; Reliability; Technological innovation; Nanoscale systems; Reliability;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.2011.1
  • Filename
    5713301
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1450222