• DocumentCode
    1450457
  • Title

    Effect of Buffer Layer Texture on the Crystallization of CoFeB and on the Tunnel Magnetoresistance in MgO Based Magnetic Tunnel Junctions

  • Author

    Cao, J. ; Kanak, J. ; Stobiecki, T. ; Wisniowski, P. ; Freitas, P.P.

  • Author_Institution
    INESC Microsistemas e Nanotecnologias (INESC MN), IN-Inst. of Nanosci. & Nanotechnol., Lisbon, Portugal
  • Volume
    45
  • Issue
    10
  • fYear
    2009
  • Firstpage
    3464
  • Lastpage
    3466
  • Abstract
    Two different buffer layers (Ta/Ru/Ta and thick Ta) were tested for MgO MTJs. The influence of buffer layer texture on the crystallization of CoFeB bottom and top electrodes and on the tunnel magnetoresistance effect was investigated. X-ray results suggest that, after anneal, the CoFeB layer above MgO is well (200) textured and it does not depend on the buffer layer since MgO (100) barrier supplies a good template for CoFeB (200) orientation, while the crystallization of bottom CoFeB layer relies on the buffer layer texture. Different from Ta (110) found in Ta/Ru/Ta buffer layer, a thick Ta buffer layer has beta-(200) texture, which induces (001) oriented grains in MnPt layer. Because of the epitaxy relationship between MnPt and FeCo with MnPt(001)[100]//FeCo(200)[110], MnPt (001) oriented grains lead to the crystallization of bottom CoFeB layer with (200) orientation. As a result, higher TMR ratio up to 290% was achieved in the EB-MTJs with thick Ta buffer layer.
  • Keywords
    annealing; boron alloys; buffer layers; cobalt alloys; crystallisation; electrodes; iron alloys; magnesium compounds; manganese alloys; platinum alloys; ruthenium; tantalum; texture; tunnelling magnetoresistance; CoFeB (200) orientation; CoFeB-MgO; MgO (100) barrier; MnPt-FeCo; Ta-Ru-Ta; annealing; buffer layer; crystallization; electrodes; magnetic tunnel junctions; texture; tunnel magnetoresistance; Buffer layer; magnetic tunnel junctions; texture; tunnel magnetoresistance;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2009.2025382
  • Filename
    5257200