DocumentCode :
1450672
Title :
Near-Surface Magnetic Structure and GMI Response in Amorphous Microwires
Author :
Óvári, Tibor-Adrian ; Corodeanu, Sorin ; Chiriac, Horia
Author_Institution :
Nat. Inst. of R&D for Tech. Phys., Iasi, Romania
Volume :
45
Issue :
10
fYear :
2009
Firstpage :
4282
Lastpage :
4285
Abstract :
Results on the giant magneto-impedance effect in thin as-cast glass-coated Co-based amorphous microwires and in such microwires after glass removal are reported. The results are explained by taking into account the complex magnetic structure of the region delimited by the magnetic penetration depth at high frequencies, which is responsible for the magnitude of the impedance variation. The interdomain wall between the inner core and the outer shell of the microwire domain structure is enclosed in this region, and it has a significant contribution to the magnitude of the impedance variation at various frequencies. Glass removal determines stress relief, which results in the expansion of the interdomain wall mostly to the detriment of the outer shell, which vanishes. The changes in the magneto-impedance effect with glass removal are fully understood only by taking into account the characteristics of the complex near-surface magnetic structure. The parameters of the magneto-impedance response of thin microwires are a consequence of the interplay among the magnetic penetration depth, the location and width of the interdomain wall, their changes with glass removal, and of the general characteristics of the domain structure.
Keywords :
amorphous state; giant magnetoresistance; glass; magnetic domain walls; magnetic structure; surface magnetism; amorphous microwires; as-cast glass-coated amorphous microwires; giant magneto-impedance effect; magnetic domain structure; magnetic interdomain wall; magnetic penetration depth; magneto-impedance effect; surface magnetic structure; Amorphous magnetic microwires; domain wall; giant magneto-impedance; magnetic domain structure;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2009.2022838
Filename :
5257233
Link To Document :
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