• DocumentCode
    1450802
  • Title

    A Bayesian framework for deformable pattern recognition with application to handwritten character recognition

  • Author

    Cheung, Kwok-Wai ; Yeung, Dit-Yan ; Chin, Roland T.

  • Author_Institution
    Dept. of Comput. Sci., Hong Kong Univ. of Sci. & Technol., Clear Water Bay, Hong Kong
  • Volume
    20
  • Issue
    12
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    1382
  • Lastpage
    1388
  • Abstract
    Deformable models have recently been proposed for many pattern recognition applications due to their ability to handle large shape variations. These proposed approaches represent patterns or shapes as deformable models, which deform themselves to match with the input image, and subsequently feed the extracted information into a classifier. The three components-modeling, matching, and classification-are often treated as independent tasks. In this paper, we study how to integrate deformable models into a Bayesian framework as a unified approach for modeling, matching, and classifying shapes. Handwritten character recognition serves as a testbed for evaluating the approach. With the use of our system, recognition is invariant to affine transformation as well as other handwriting variations. In addition, no preprocessing or manual setting of hyperparameters (e.g., regularization parameter and character width) is required. Besides, issues on the incorporation of constraints on model flexibility, detection of subparts, and speed-up are investigated. Using a model set with only 23 prototypes without any discriminative training, we can achieve an accuracy of 94.7 percent with no rejection on a subset (11,791 images by 100 writers) of handwritten digits from the NIST SD-1 dataset
  • Keywords
    Bayes methods; handwritten character recognition; Bayesian framework; NIST SD-1 dataset; affine transformation invariance; classification; deformable models; deformable pattern recognition; handwritten character recognition; matching; model flexibility; modeling; shape variations; speed-up; subpart detection; Bayesian methods; Character recognition; Data mining; Deformable models; Feeds; Impedance matching; Pattern matching; Pattern recognition; Shape; Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.735813
  • Filename
    735813