• DocumentCode
    1451558
  • Title

    The third millennium´s test dilemma

  • Author

    Bottoms, Bill

  • Author_Institution
    Credence Syst. Corp., Fremont, CA, USA
  • Volume
    15
  • Issue
    4
  • fYear
    1998
  • Firstpage
    7
  • Lastpage
    11
  • Abstract
    The president and CEO of Credence Systems, Bill Bottoms, addressed the VLSI test symposium held last April in Monterey, California. His keynote covered some of the challenges test engineers must face in the future. Specifically, Bottoms focused on what´s driving the increase in test cost and what the industry can do about it
  • Keywords
    VLSI; integrated circuit testing; VLSI test symposium; test cost; Acceleration; Automatic testing; Circuit optimization; Costs; Integrated circuit testing; Logic; Microprocessors; Moore´s Law; System testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.735921
  • Filename
    735921
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1451558