• DocumentCode
    1451594
  • Title

    Online current testing

  • Author

    Lo, Jien-Chung

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA
  • Volume
    15
  • Issue
    4
  • fYear
    1998
  • Firstpage
    49
  • Lastpage
    56
  • Abstract
    Testing professionals must choose the online VLSI testing technique most suitable for mission goals with respect to design complexity, fault coverage, safety level, and product value. Online current testing techniques provide potential solutions to reliability problems in a wide spectrum of fault-tolerant applications
  • Keywords
    VLSI; fault tolerance; integrated circuit testing; design complexity; fault coverage; fault-tolerant applications; online VLSI testing; online current testing; product value; reliability problems; safety level; Alpha particles; Availability; Circuit faults; Circuit testing; Fault tolerance; Fixtures; Integrated circuit testing; Manufacturing; Safety; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.735927
  • Filename
    735927
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1451594