• DocumentCode
    1451619
  • Title

    Using laser defect avoidance to build large-area FPGAs

  • Author

    Chapman, Glenn H. ; Dufort, Benoit

  • Author_Institution
    Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
  • Volume
    15
  • Issue
    4
  • fYear
    1998
  • Firstpage
    75
  • Lastpage
    81
  • Abstract
    Wafer-scale techniques of defect avoidance expend the complexity limits of field-programmable gate arrays by routing around flawed blocks to build working systems. Experiments on test FPGAs show that laser defect avoidance produces signal delays half those of active switches
  • Keywords
    computational complexity; delays; field programmable gate arrays; logic arrays; defect avoidance; field-programmable gate arrays; large-area FPGAs; laser defect avoidance; signal delays; wafer-scale techniques; CMOS technology; Circuits; Delay; Field programmable gate arrays; Laser beam cutting; Optical design; Redundancy; Routing; Switches; Testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.735930
  • Filename
    735930
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1451619