• DocumentCode
    1451728
  • Title

    Characterisation of electric field assisted diffused potassium ion planar optical waveguides

  • Author

    Batchelor, S. ; Oven, Robert

  • Author_Institution
    Electron. Eng. Labs., Kent Univ., Canterbury
  • Volume
    32
  • Issue
    22
  • fYear
    1996
  • fDate
    10/24/1996 12:00:00 AM
  • Firstpage
    2082
  • Lastpage
    2083
  • Abstract
    A simple drift transport model is used to predict the depth of planar optical waveguides produced by the electric field assisted ion exchange of potassium ions into soda-lime glass. The guide depth can be represented by a simple universal function of the voltage-process time product. The model is fitted to experimental data over a wide range of applied potentials and times. Joule heating effects limit the accuracy of the model at large current densities
  • Keywords
    current density; diffusion; electromigration; ion exchange; optical fabrication; optical planar waveguides; potassium; Joule heating effects; K; K ion exchange; applied potentials; current densities; drift transport model; electric field assisted diffused waveguide; electric field assisted ion exchange; guide depth; planar optical waveguides; soda-lime glass; voltage-process time product;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19961393
  • Filename
    543829