DocumentCode :
1451728
Title :
Characterisation of electric field assisted diffused potassium ion planar optical waveguides
Author :
Batchelor, S. ; Oven, Robert
Author_Institution :
Electron. Eng. Labs., Kent Univ., Canterbury
Volume :
32
Issue :
22
fYear :
1996
fDate :
10/24/1996 12:00:00 AM
Firstpage :
2082
Lastpage :
2083
Abstract :
A simple drift transport model is used to predict the depth of planar optical waveguides produced by the electric field assisted ion exchange of potassium ions into soda-lime glass. The guide depth can be represented by a simple universal function of the voltage-process time product. The model is fitted to experimental data over a wide range of applied potentials and times. Joule heating effects limit the accuracy of the model at large current densities
Keywords :
current density; diffusion; electromigration; ion exchange; optical fabrication; optical planar waveguides; potassium; Joule heating effects; K; K ion exchange; applied potentials; current densities; drift transport model; electric field assisted diffused waveguide; electric field assisted ion exchange; guide depth; planar optical waveguides; soda-lime glass; voltage-process time product;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19961393
Filename :
543829
Link To Document :
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