DocumentCode
1452240
Title
High voltage pulses for high impedance loads using explosive formed fuses
Author
Degnan, James H. ; Kiuttu, Gerald F. ; Turchi, Peter J. ; Graham, Jack D. ; Goforth, James H. ; Lopez, Emmanuel A. ; Oona, H. ; Tasker, Douglas G.
Author_Institution
Air Force Res. Labs., Kirtland AFB, NM, USA
Volume
26
Issue
5
fYear
1998
fDate
10/1/1998 12:00:00 AM
Firstpage
1437
Lastpage
1443
Abstract
Explosive formed fuses (EFFs) use conducting elements that are deformed by explosive pressure (typically, against dielectric dies). This causes the fuse geometry to change, so that the conducting element cross section decreases. This enables a higher ratio of current conduction to current interrupt time than for normal fuses, and it enables more control of when current interruption occurs. In combination with a suitable output closing switch, EFF´s can be used to obtain several hundred kilovolt voltage pulses from inductive stores to drive several ohm loads. With proper choices of inductive store, EFF geometry and material, and output closing switch features, such a voltage pulse can be approximately flat topped for microsecond duration and have a small fraction of microsecond risetime. We present theoretical analysis and circuit simulations which illustrate this, using scaled empirical EFF parameters for inductive stores in the 1 weber flux, several hundred nanohenry range. The circuit simulations were done using MicroCap-IV, with user defined elements. These simulations were done with static inductive stores and with explosive magnetic flux compression generators driving inductive stores
Keywords
circuit simulation; electric fuses; plasma switches; switchgear; MicroCap-IV; circuit simulations; conducting elements; current conduction; current interrupt time; dielectric dies; explosive formed fuses; explosive magnetic flux compression generators; explosive pressure; fuse geometry; high impedance loads; high voltage pulses; inductive stores; microsecond risetime; output closing switch; static inductive stores; Circuit analysis; Circuit simulation; Dielectrics; Explosives; Fuses; Geometry; Impedance; Magnetic analysis; Switches; Voltage;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/27.736034
Filename
736034
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