DocumentCode :
1452240
Title :
High voltage pulses for high impedance loads using explosive formed fuses
Author :
Degnan, James H. ; Kiuttu, Gerald F. ; Turchi, Peter J. ; Graham, Jack D. ; Goforth, James H. ; Lopez, Emmanuel A. ; Oona, H. ; Tasker, Douglas G.
Author_Institution :
Air Force Res. Labs., Kirtland AFB, NM, USA
Volume :
26
Issue :
5
fYear :
1998
fDate :
10/1/1998 12:00:00 AM
Firstpage :
1437
Lastpage :
1443
Abstract :
Explosive formed fuses (EFFs) use conducting elements that are deformed by explosive pressure (typically, against dielectric dies). This causes the fuse geometry to change, so that the conducting element cross section decreases. This enables a higher ratio of current conduction to current interrupt time than for normal fuses, and it enables more control of when current interruption occurs. In combination with a suitable output closing switch, EFF´s can be used to obtain several hundred kilovolt voltage pulses from inductive stores to drive several ohm loads. With proper choices of inductive store, EFF geometry and material, and output closing switch features, such a voltage pulse can be approximately flat topped for microsecond duration and have a small fraction of microsecond risetime. We present theoretical analysis and circuit simulations which illustrate this, using scaled empirical EFF parameters for inductive stores in the 1 weber flux, several hundred nanohenry range. The circuit simulations were done using MicroCap-IV, with user defined elements. These simulations were done with static inductive stores and with explosive magnetic flux compression generators driving inductive stores
Keywords :
circuit simulation; electric fuses; plasma switches; switchgear; MicroCap-IV; circuit simulations; conducting elements; current conduction; current interrupt time; dielectric dies; explosive formed fuses; explosive magnetic flux compression generators; explosive pressure; fuse geometry; high impedance loads; high voltage pulses; inductive stores; microsecond risetime; output closing switch; static inductive stores; Circuit analysis; Circuit simulation; Dielectrics; Explosives; Fuses; Geometry; Impedance; Magnetic analysis; Switches; Voltage;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.736034
Filename :
736034
Link To Document :
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