DocumentCode :
1452330
Title :
Can Junction Temperature Alone Characterize Thermal Performance of White LED Emitters?
Author :
Yan, Bohan ; Tran, Nguyen T. ; You, Jiun-Pyng ; Shi, Frank G.
Author_Institution :
Optoelectron. Integration & Packaging Lab., Univ. of California, Irvine, CA, USA
Volume :
23
Issue :
9
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
555
Lastpage :
557
Abstract :
Thermal performance of phosphor-based white light emitting diodes (LEDs) under an input current of 350 mA is investigated by finite-element simulation in which the thermal and optical interactions are considered. It is demonstrated that the temperature of the phosphor particles, regardless of phosphor placement, is always higher than the junction temperature. It is concluded that the junction temperature, which characterizes the thermal behavior of monotonic color LED emitters, cannot be used alone for characterizing the thermal behavior of white LED emitters. In fact, the phosphor temperature is critical in determining the lumen performance and reliability of white LED emitters. In addition, the phosphor temperature is effectively reduced by coating the phosphors directly on the chip and maintaining a relatively higher phosphor concentration (above 60 wt.%) in the phosphor-silicone mixture layer.
Keywords :
finite element analysis; light emitting diodes; phosphors; silicones; coating; current 350 mA; finite element simulation; junction temperature; light emitting diodes; lumen performance; phosphor; reliability; silicone; thermal performance; white LED emitters; Coatings; Heating; Junctions; Light emitting diodes; Phosphors; Temperature measurement; Thermal conductivity; Finite-element methods; phosphor temperature; thermal characterization; white light-emitting diodes (LEDs);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2011.2115997
Filename :
5714712
Link To Document :
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