DocumentCode
1452450
Title
Longitudinal and Transverse Cross-Sectional Microstructure and Critical Current Density in
Superconductors
Author
Pong, Ian ; Oberli, Luc-Rene ; Bottura, Luca ; Scheuerlein, Christian
Author_Institution
CERN, Geneva, Switzerland
Volume
21
Issue
3
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
2537
Lastpage
2540
Abstract
The longitudinal and transverse cross-sectional microstructures of several internal tin Nb3Sn strands have been systematically investigated. The critical current densities of these strands were then correlated with their design parameters. It is observed that the occurrence of certain coarse grain structures is related to the location of the filaments with respect to the subelements as well as to the strand. Experimental evidence suggests that the existence of these coarse grains is related to Sn distribution during the early stages of the heat treatment. It is also noticed that some coarse grains have high aspect ratio features, confirming the need to study the longitudinal fracture surface. We report in this paper the observation of some unusual grain sizes and morphologies. It appears that, of the high-Sn content Nb3Sn conductors investigated in this paper, a strand´s global composition has a weaker influence on the critical current density (Jc) than local and structural factors, such as the local Cu:Nb area ratio (LAR) and filament layout.
Keywords
critical current density (superconductivity); grain size; niobium alloys; tin alloys; type II superconductors; Nb3Sn; critical current density; filament layout; grain morphology; grain size; longitudinal cross-sectional microstructure; structural factors; superconductor; transverse cross-sectional microstructure; Copper; Critical current density; Microstructure; Niobium; Surface cracks; Tin; Wires; ${rm Nb}_{3}{rm Sn}$ ; Critical current; Cu-Nb-Sn; fractography; internal tin; microstructure; superconductor;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2011.2106473
Filename
5714730
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