Quasi-exact optical analysis of oxide-apertured microcavity VCSELs using vector finite elements

Author

Noble, Michael J. ; Lott, James A. ; Loehr, John P.

Author_Institution

Air Force Res. Lab. Sensors Directorate, Hanscom AFB, MA, USA

Volume

34

Issue

12

fYear

1998

fDate

12/1/1998 12:00:00 AM

Firstpage

2327

Lastpage

2339

Abstract

We report a new full vector finite element model for analyzing the optical properties of azimuthally symmetric oxide-apertured vertical-cavity surface emitting lasers (VCSELs). Our model allows for quasi-exact calculation of the lasing mode blueshift, threshold gain, and field profile. Through a detailed analysis of a sample VCSEL, we ascertain the physical effects which determine diffractive or parasitic mode loss. They are: 1) the background density of parasitic modes and 2) the coupling strength between the lasing mode and the parasitic mode continuum. The coupling strength is in turn determined by the relative alignment between the lasing and parasitic mode propagation vectors and the lasing mode penetration into the oxide region. This analysis improves our understanding of the optical physics of apertured VCSELs and should enable the next leap down in lasing threshold

Keywords

finite element analysis; laser modes; laser theory; microcavity lasers; semiconductor lasers; surface emitting lasers; coupling strength; diffractive mode loss; field profile; lasing mode blueshift; optical properties; oxide apertured microcavity VCSEL; parasitic mode loss; threshold gain; vector finite element model; Finite element methods; Laser modes; Laser theory; Microcavities; Optical diffraction; Optical losses; Optical propagation; Stimulated emission; Surface emitting lasers; Vertical cavity surface emitting lasers;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.736102

Filename

736102