• DocumentCode
    1452832
  • Title

    Cycle-accurate macro-models for RT-level power analysis

  • Author

    Wu, Qing ; Qiu, Qinru ; Pedram, Massoud ; Ding, Chih-Shun

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    6
  • Issue
    4
  • fYear
    1998
  • Firstpage
    520
  • Lastpage
    528
  • Abstract
    In this paper, we present a methodology and techniques for generating cycle-accurate macro-models for register transfer (RT)-level power analysis. The proposed macro-model predicts not only the cycle-by-cycle power consumption of a module, but also the moving average of power consumption and the power profile of the module over time. We propose an exact power function and approximation steps to generate our power macro-model. First-order temporal correlations and spatial correlations of up to order three are considered in order to improve the estimation accuracy. A variable reduction algorithm is designed to eliminate the "insignificant" variables using a statistical sensitivity test. Population stratification is employed to increase the model fidelity. Experimental results show our macro-models with 15 or fewer variables, exhibit <5% error for average power and <20% errors for cycle-by-cycle power estimation compared to circuit simulation results using Powermill.
  • Keywords
    VLSI; high level synthesis; integrated circuit design; integrated circuit modelling; low-power electronics; statistical analysis; VLSI; circuit simulation; cycle-accurate macro-model; low power design; population stratification; power consumption; power estimation; register transfer level power analysis; regression; statistical sensitivity; variable reduction algorithm; Algorithm design and analysis; Capacitance; Circuit simulation; Circuit testing; Computational modeling; Design automation; Energy consumption; Equations; Information analysis; Power generation;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.736123
  • Filename
    736123