• DocumentCode
    1452919
  • Title

    On circuit clustering for area/delay tradeoff under capacity and pin constraints

  • Author

    Huang, Juinn-Dar ; Jou, Jing-Yang ; Shen, Wen-Zen ; Chuang, Hsien-Ho

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    6
  • Issue
    4
  • fYear
    1998
  • Firstpage
    634
  • Lastpage
    642
  • Abstract
    In this paper, we propose an iterative area/delay tradeoff algorithm to solve the circuit clustering problem under the capacity constraint. It first finds an initial delay-considered area-optimized clustering solution by a delay-oriented depth first-search procedure. Then, an iterative procedure consisting of several reclustering techniques is applied to gradually trade the area for the performance. We then show that this algorithm can be easily extended to solve the clustering problem subject to both capacity and pin constraints. Experimental results show that our algorithm can provide a complete set of clustering solutions from the area-optimized one to the delay-optimized one for a given circuit. Furthermore, compared to the existing delay-optimized algorithms, this algorithm achieves almost the same performance but with much less area overhead. Therefore, this algorithm is very useful for solving the timing-driven circuit clustering problem.
  • Keywords
    VLSI; delays; integrated circuit design; iterative methods; logic CAD; logic partitioning; VLSI; area overhead; capacity constraints; circuit clustering; delay-oriented depth first-search procedure; iterative area/delay tradeoff algorithm; logic partitioning techniques; pin constraints; reclustering techniques; Circuit synthesis; Clustering algorithms; Delay effects; Integrated circuit interconnections; Iterative algorithms; Joining processes; Logic gates; Partitioning algorithms; Polynomials; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.736137
  • Filename
    736137