Title :
Electrooptic probing of MMIC devices with a semiconductor laser using a novel method for phase referencing
Author :
Harvey, G.T. ; Heutmaker, M.S. ; Cook, T.B. ; Perino, J.S.
Author_Institution :
AT&T Bell Lab., Princeton, NJ, USA
fDate :
6/1/1991 12:00:00 AM
Abstract :
Measurements were made of both the phase and amplitude frequency response of GaAs MMICs (monolithic microwave integrated circuits) over a range of 2 to 18 GHz using electrooptic sampling with a gain-switched semiconductor laser. A novel phase-referencing technique allows accurate frequency scans of the phase response by eliminating problems associated with phase changes between the synthesizers driving the circuit and the laser. Using coated optics and differential detection, a voltage resolution of 0.5 mV/ square root Hz, within 4 dB of the shot-noise limit, has been achieved.<>
Keywords :
III-V semiconductors; MMIC; field effect integrated circuits; gallium arsenide; integrated circuit testing; measurement by laser beam; microwave measurement; GaAs; MMIC devices; amplitude frequency response; coated optics; differential detection; electrooptic sampling; frequency scans; gain-switched semiconductor laser; monolithic microwave integrated circuits; phase frequency response; phase referencing; semiconductor laser; semiconductors; shot-noise limit; synthesizers; voltage resolution; Electrooptic devices; Frequency measurement; Gain measurement; Integrated circuit measurements; Lasers and electrooptics; MMICs; Masers; Microwave measurements; Phase measurement; Semiconductor lasers;
Journal_Title :
Photonics Technology Letters, IEEE
