DocumentCode :
1453176
Title :
Behavior of post insulators during UHV dc test
Author :
Osswald, F. ; Roumié, M.
Author_Institution :
Inst. de Recherches Subatomiques, CNRS, Strasbourg, France
Volume :
8
Issue :
1
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
150
Lastpage :
156
Abstract :
This paper presents experimental results on post insulators subjected to ultra high dc voltages in the range of 1 to 4.8 MV. The behavior of new and aged insulators has been studied recently during diagnostic and accelerated aging tests, in order to characterize both their withstand and recovery voltages, as well as estimate their remaining life time. Estimation of their remaining life time enables a better prediction of maintenance intervals, thus avoiding unnecessary and costly downtime periods. Measurements of the recovery voltage also have been performed on insulators presenting defects, following dielectric failure in service. The results of the accelerated aging tests carried out demonstrates a faster assessment of the post insulators performance
Keywords :
ageing; insulator testing; life testing; 1 to 4.8 MV; UHV DC testing; accelerated aging; dielectric failure; insulation diagnosis; insulation lifetime; post insulator; recovery voltage; withstand voltage; Accelerated aging; Dielectrics and electrical insulation; Electrodes; Insulator testing; Life estimation; Life testing; Stress; Sulfur hexafluoride; Surges; Voltage;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/94.910438
Filename :
910438
Link To Document :
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