• DocumentCode
    1453181
  • Title

    Conservation of complex power technique for waveguide junctions with finite wall conductivity

  • Author

    Wade, J. Douglas ; Macphie, Robert H.

  • Author_Institution
    Herzberg Inst. for Astrophys., Ottawa, Ont., Canada
  • Volume
    38
  • Issue
    4
  • fYear
    1990
  • fDate
    4/1/1990 12:00:00 AM
  • Firstpage
    373
  • Lastpage
    378
  • Abstract
    Scattering at the junction of two waveguides with finite wall conductivity is rigorously treated using E-field mode matching and the conservation of complex power technique. At the transverse junction discontinuity between the two waveguides, the complex power absorbed by the junction wall is taken into account along with the usual transfer of complex power from one guide to the other. This leads to a generalized form of the scattering matrix [S] of the lossy junction which incorporates the surface impedance Zm of the transverse metallic wall, assumed to be a good conductor. The specific case of a copper transverse diaphragm with centered circular iris in an X-band guide is considered and the equivalent TE10 shunt admittance is computed. Numerical results are also given for lossy X-band cavity resonators with circular coupling holes
  • Keywords
    S-matrix theory; cavity resonators; electromagnetic wave scattering; losses; waveguide couplers; waveguide theory; Cu transverse diaphragm; E-field mode matching; TE10 shunt admittance; X-band; cavity resonators; centered circular iris; circular coupling holes; complex power conservation; conservation of complex power technique; finite wall conductivity; lossy junction; scattering matrix; surface impedance; transverse junction discontinuity; transverse metallic wall; waveguide junctions; waveguide wall losses; Conductivity; Conductors; Copper; Iris; Scattering; Surface impedance; Tellurium; Transmission line matrix methods; Waveguide discontinuities; Waveguide junctions;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.52577
  • Filename
    52577