DocumentCode :
1453192
Title :
Mechanism study of porcine skin ablation by nanosecond laser pulses at 1064, 532, 266, and 213 nm
Author :
Hu, Xin-Hua ; Fang, Qiyin ; Cariveau, Mickael J. ; Pan, Xiaoning ; Kalmus, Gerhard W.
Author_Institution :
Dept. of Phys., East Carolina Univ., Greenville, NC, USA
Volume :
37
Issue :
3
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
322
Lastpage :
328
Abstract :
The ablation mechanism of fresh porcine skin has been studied using nanosecond laser pulses at the wavelengths of 1064, 532, 266, and 213 nm. We have identified the Na spectral line at 589 nm in the secondary radiation from the ablated skin sample as the signature of tissue ablation and measured the ablation probability near ablation threshold. Ablation depth per pulse has been measured by histological examination of ablated skin samples. Review of the ablation probability data through probit analysis indicated that the same mechanism is likely to be operative for tissue ablation at all four wavelengths. Various soft tissue ablation models are discussed, and it is concluded that the ablation of the skin by nanosecond laser pulses from 1064 to 213 nm is a result of electronic impact ionization which leads to the formation of a plasma
Keywords :
high-speed optical techniques; laser ablation; laser applications in medicine; skin; surgery; 1064 nm; 1064 to 213 nm; 213 nm; 266 nm; 532 nm; 589 nm; Na; Na spectral line; ablated skin sample; ablation; ablation depth; ablation mechanism; ablation probability; ablation probability data; ablation threshold; electronic impact ionization; fresh porcine skin; histological examination; nanosecond laser pulses; plasma formation; porcine skin ablation; probit analysis; secondary radiation; signature; skin; skin ablation; soft tissue ablation models; tissue ablation; Biological tissues; Data analysis; Impact ionization; Laser ablation; Laser modes; Optical pulses; Plasma waves; Pulse measurements; Skin; Wavelength measurement;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.910440
Filename :
910440
Link To Document :
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