DocumentCode
1453278
Title
Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits
Author
Konuk, Haluk ; Ferguson, F. Joel
Author_Institution
Hewlett-Packard Co., Palo Alto, CA, USA
Volume
17
Issue
11
fYear
1998
fDate
11/1/1998 12:00:00 AM
Firstpage
1200
Lastpage
1210
Abstract
Shorts and opens are the most common types of catastrophic defects in today´s CMOS ICs. In this paper, we show that an open in the interconnect wiring of a digital CMOS circuit, which permanently disconnects inputs of logic gates from their driver, can cause oscillation or sequential behavior. We present supporting experimental data collected by creating an interconnect open in a manufactured chip. We also show that the conditions for oscillation and sequential behavior are likely to occur in many interconnect opens
Keywords
CMOS digital integrated circuits; circuit oscillations; integrated circuit interconnections; logic gates; network routing; CMOS IC; catastrophic defect; digital circuit; interconnect wiring; logic gate; open; oscillation; routing; sequential behavior; CMOS digital integrated circuits; CMOS logic circuits; Capacitance; Circuit faults; Driver circuits; Feedback circuits; Integrated circuit interconnections; Routing; Wires; Wiring;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.736192
Filename
736192
Link To Document