• DocumentCode
    1453278
  • Title

    Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits

  • Author

    Konuk, Haluk ; Ferguson, F. Joel

  • Author_Institution
    Hewlett-Packard Co., Palo Alto, CA, USA
  • Volume
    17
  • Issue
    11
  • fYear
    1998
  • fDate
    11/1/1998 12:00:00 AM
  • Firstpage
    1200
  • Lastpage
    1210
  • Abstract
    Shorts and opens are the most common types of catastrophic defects in today´s CMOS ICs. In this paper, we show that an open in the interconnect wiring of a digital CMOS circuit, which permanently disconnects inputs of logic gates from their driver, can cause oscillation or sequential behavior. We present supporting experimental data collected by creating an interconnect open in a manufactured chip. We also show that the conditions for oscillation and sequential behavior are likely to occur in many interconnect opens
  • Keywords
    CMOS digital integrated circuits; circuit oscillations; integrated circuit interconnections; logic gates; network routing; CMOS IC; catastrophic defect; digital circuit; interconnect wiring; logic gate; open; oscillation; routing; sequential behavior; CMOS digital integrated circuits; CMOS logic circuits; Capacitance; Circuit faults; Driver circuits; Feedback circuits; Integrated circuit interconnections; Routing; Wires; Wiring;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.736192
  • Filename
    736192