Title :
Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits
Author :
Konuk, Haluk ; Ferguson, F. Joel
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
fDate :
11/1/1998 12:00:00 AM
Abstract :
Shorts and opens are the most common types of catastrophic defects in today´s CMOS ICs. In this paper, we show that an open in the interconnect wiring of a digital CMOS circuit, which permanently disconnects inputs of logic gates from their driver, can cause oscillation or sequential behavior. We present supporting experimental data collected by creating an interconnect open in a manufactured chip. We also show that the conditions for oscillation and sequential behavior are likely to occur in many interconnect opens
Keywords :
CMOS digital integrated circuits; circuit oscillations; integrated circuit interconnections; logic gates; network routing; CMOS IC; catastrophic defect; digital circuit; interconnect wiring; logic gate; open; oscillation; routing; sequential behavior; CMOS digital integrated circuits; CMOS logic circuits; Capacitance; Circuit faults; Driver circuits; Feedback circuits; Integrated circuit interconnections; Routing; Wires; Wiring;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on