• DocumentCode
    1453577
  • Title

    NV-SRAM: a nonvolatile SRAM with backup ferroelectric capacitors

  • Author

    Miwa, Tohru ; Yamada, Junichi ; Koike, Hiroki ; Toyoshima, Hideo ; Amanuma, Kazushi ; Kobayashi, Sota ; Tatsumi, Toru ; Maejima, Yukihiko ; Hada, Hiromitsu ; Kunio, Takemitsu

  • Author_Institution
    Syst. Devices & Fundamental Res., NEC Corp., Kanagawa, Japan
  • Volume
    36
  • Issue
    3
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    522
  • Lastpage
    527
  • Abstract
    This paper demonstrates new circuit technologies that enable a 0.25-μm ASIC SRAM macro to be nonvolatile with only a 17% cell-area overhead. New capacitor-on-metal/via-stacked-plug process technologies permit a nonvolatile SRAM (NV-SRAM) cell to consist of a six-transistor ASIC SRAM cell and two backup ferroelectric capacitors stacked over the SRAM portion. READ and WRITE operations in this NV-SRAM cell are very similar to those of a standard SRAM, and this NV-SRAM shares almost all the circuit properties of a standard SRAM. Because each memory cell can perform STORE and RECALL individually, both can execute massive-parallel operations. A Vdd/2 plate-line architecture makes READ/WRITE fatigue negligible. A 512-byte test chip was successfully fabricated to show compatibility with ASIC technologies
  • Keywords
    SRAM chips; application specific integrated circuits; cellular arrays; ferroelectric capacitors; ferroelectric storage; parallel memories; 0.25 micron; ASIC; NV-SRAM; backup ferroelectric capacitors; capacitor-on-metal/via-stacked-plug process technologies; cell-area overhead; circuit properties; massive-parallel operations; nonvolatile SRAM; plate-line architecture; Application specific integrated circuits; Capacitors; EPROM; Fatigue; Ferroelectric films; Ferroelectric materials; Flash memory; Nonvolatile memory; Random access memory; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.910492
  • Filename
    910492