DocumentCode :
1453743
Title :
Effect of dead space on the excess noise factor and time response of avalanche photodiodes
Author :
Saleh, Bahaa E A ; Hayat, Majeed M. ; Teich, Malvin C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Volume :
37
Issue :
9
fYear :
1990
fDate :
9/1/1990 12:00:00 AM
Firstpage :
1976
Lastpage :
1984
Abstract :
The effect of dead space on the statistics of the gain process in continuous-multiplication avalanche photodiodes (APDs) is determined using the theory of age-dependent branching processes. The dead space is the minimum distance that a newly generated carrier must travel in order to acquire sufficient energy to cause an impact ionization. Analytical expressions are derived for the mean gain, the excess noise factor, and the mean and standard deviation of the impulse response function, for the dead-space-modified avalanche photodiode (DAPD), under conditions of single carrier multiplication. The results differ considerably from the well-known formulas derived by R.J. McIntyre and S.D. Personick in the absence of dead space. Relatively simple asymptotic expressions for the mean gain and excess noise factor are obtained for devices with long multiplication regions. In terms of the signal-to-noise ratio (SNR) of an optical receiver in the presence of circuit noise, it is established that there is a salutory effect of using a properly designed DAPD in place of a conventional APD. The relative merits of using DAPD versus a multilayer (superlattice) avalanche photodiode (SAPD) are examined in the context of receiver SNR; the best choice turns out to depend on which device parameters are used for the comparison
Keywords :
avalanche photodiodes; electron device noise; impact ionisation; random noise; statistical analysis; transient response; age-dependent branching processes; analytical expressions; asymptotic expressions; circuit noise; continuous-multiplication avalanche photodiodes; dead space effect; excess noise factor; gain process; generated carrier; impact ionization; impulse response function; long multiplication regions; mean deviation; mean gain; optical receiver; signal-to-noise ratio; single carrier multiplication; standard deviation; superlattice avalanche photodiode; the excess noise factor; time response; Avalanche photodiodes; Circuit noise; Impact ionization; Optical design; Optical noise; Optical receivers; Signal to noise ratio; Space exploration; Statistics; Time factors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.57159
Filename :
57159
Link To Document :
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