DocumentCode :
1453839
Title :
Microwave imaging within the second-order Born approximation: stochastic optimization by a genetic algorithm
Author :
Caorsi, Salvatore ; Costa, Antonio ; Pastorino, Matteo
Author_Institution :
Dept. of Electron., Pavia Univ., Italy
Volume :
49
Issue :
1
fYear :
2001
fDate :
1/1/2001 12:00:00 AM
Firstpage :
22
Lastpage :
31
Abstract :
This paper addresses the problem of reconstructing the location, shape, and dielectric permittivity distribution of an inhomogeneous dielectric object from measurements of the field scattered by the object. The object is an inhomogeneous infinite cylinder of arbitrary cross section illuminated by a transverse magnetic incident electric field. The approach is based on the Lippmann-Schuringer integral equation for the electromagnetic inverse scattering problem, approximated by applying the second-order Born approximation, which allows an extension of the range of contrast values that can be accurately imaged. The numerical approach is developed in the spatial domain and makes use of a multi-illumination multiview processing. In particular, the inverse problem is recast in a global nonlinear optimization problem (including a penalty function), solved by a stochastic method based on a genetic algorithm. In this paper, the mathematical formulation of the approach is described and the results of several dielectric reconstructions are reported, including comparisons with analogous reconstructions performed within the linearized (first-order) Born approximation
Keywords :
approximation theory; dielectric bodies; electric fields; electromagnetic wave scattering; genetic algorithms; image reconstruction; inverse problems; microwave imaging; permittivity; stochastic processes; Lippmann-Schuringer integral equation; contrast values; dielectric permittivity distribution; dielectric reconstruction; electromagnetic inverse scattering problem; first-order Born approximation; genetic algorithm; global nonlinear optimization; inhomogeneous dielectric object; inverse problem; location reconstruction; microwave imaging; multi-illumination multiview processing; penalty function; scattered field; second-order Born approximation; shape reconstruction; spatial domain; stochastic method; stochastic optimization; transverse magnetic incident electric field; Approximation methods; Dielectric measurements; Electromagnetic scattering; Image reconstruction; Inverse problems; Magnetic field measurement; Microwave imaging; Nonuniform electric fields; Permittivity measurement; Shape measurement;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.910525
Filename :
910525
Link To Document :
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