DocumentCode :
1453952
Title :
An Algorithm for Efficient and Effective Evaluation of Scattering From Fractal Surfaces
Author :
Perna, Stefano ; Iodice, Antonio
Author_Institution :
Dipt. per le Tecnol. (DIT), Univ. degli Studi di Napoli Parthenope, Naples, Italy
Volume :
50
Issue :
9
fYear :
2012
Firstpage :
3554
Lastpage :
3566
Abstract :
In recent years, it has been shown that use of the Kirchhoff approximation allows expressing the field scattered by a fractal surface in terms of two series expansions. A rigorous analysis of the properties of such two series has been addressed in the recent literature, aimed at finding suitable truncation criteria to compute, with a controlled absolute error, the field scattered by a fractal surface. In this paper, we first of all note that aforementioned analysis applies not only to the Kirchhoff approach, but also to more advanced approaches for surface scattering evaluation. Then, we address the use of the aforementioned series and truncation criteria to achieve a controlled relative rather than absolute error. According to such an analysis, an algorithm is provided, which allows to automatically choose which of the two series, if any, can be used, and how it can be properly truncated for efficient and effective (i.e., with a controlled relative error) computation of the field scattered by natural surfaces. An example of the application of the proposed algorithm to synthetic aperture radar data simulation is also provided.
Keywords :
fractals; geophysical techniques; remote sensing; Kirchhoff approximation; controlled absolute error; fractal surface; series expansion; surface scattering evaluation; truncation criteria; Accuracy; Algorithm design and analysis; Fractals; Indexes; Scattering; Surface waves; Synthetic aperture radar; Fractals; scattering from natural surfaces; series expansions;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
Publisher :
ieee
ISSN :
0196-2892
Type :
jour
DOI :
10.1109/TGRS.2011.2182355
Filename :
6155740
Link To Document :
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