DocumentCode :
1454059
Title :
Test facilities for electronic industry
Author :
Swaroop, D
Volume :
11
Issue :
1
fYear :
1973
Firstpage :
28
Lastpage :
29
fLanguage :
English
Journal_Title :
India, IEE-IERE Proceedings -
Publisher :
iet
ISSN :
0018-9146
Type :
jour
DOI :
10.1049/iipi.1973.0007
Filename :
5257862
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1454059
