DocumentCode :
1454155
Title :
2-ps Hard X-Ray Streak Camera Measurements at Sector 7 Beamline of the Advanced Photon Source
Author :
Chollet, Matthieu ; Ahr, Brian ; Walko, Donald A. ; Rose-Petruck, Christoph ; Adams, Bernhard
Author_Institution :
Adv. Photon Source, Argonne Nat. Lab., Argonne, IL, USA
Volume :
18
Issue :
1
fYear :
2012
Firstpage :
66
Lastpage :
73
Abstract :
A hard X-ray streak camera capable of 2-ps time resolution is in operation at the Sector 7 beamline of the Advanced Photon Source. It is used for laser-pump, X-ray probe experiments using the Ti:Sapphire femtosecond laser system installed on the beamline. This streak camera, combined with standardized and prealigned experimental setups, can perform time-resolved liquid-phase absorption spectroscopy, reflectivity, and diffraction experiments.
Keywords :
X-ray imaging; X-ray optics; X-ray spectroscopy; sapphire; solid lasers; streak cameras; titanium; Al2O3:Ti; Sector 7 beamline; X-ray probe experiments; advanced photon source; diffraction experiment; femtosecond laser system; hard X-ray streak camera measurement; laser-pump; reflectivity experiment; time 2 ps; time-resolved liquid-phase absorption spectroscopy; Cameras; Cathodes; Laser beams; Lenses; Measurement by laser beam; Switches; X-ray lasers; Diffraction; X-ray; X-ray absorption near-edge spectroscopy (XANES); streak camera; time resolved;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2011.2105464
Filename :
5716654
Link To Document :
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