2-ps Hard X-Ray Streak Camera Measurements at Sector 7 Beamline of the Advanced Photon Source

Author

Chollet, Matthieu ; Ahr, Brian ; Walko, Donald A. ; Rose-Petruck, Christoph ; Adams, Bernhard

Author_Institution

Adv. Photon Source, Argonne Nat. Lab., Argonne, IL, USA

Volume

18

Issue

1

fYear

2012

Firstpage

66

Lastpage

73

Abstract

A hard X-ray streak camera capable of 2-ps time resolution is in operation at the Sector 7 beamline of the Advanced Photon Source. It is used for laser-pump, X-ray probe experiments using the Ti:Sapphire femtosecond laser system installed on the beamline. This streak camera, combined with standardized and prealigned experimental setups, can perform time-resolved liquid-phase absorption spectroscopy, reflectivity, and diffraction experiments.

Keywords

X-ray imaging; X-ray optics; X-ray spectroscopy; sapphire; solid lasers; streak cameras; titanium; Al₂O₃:Ti; Sector 7 beamline; X-ray probe experiments; advanced photon source; diffraction experiment; femtosecond laser system; hard X-ray streak camera measurement; laser-pump; reflectivity experiment; time 2 ps; time-resolved liquid-phase absorption spectroscopy; Cameras; Cathodes; Laser beams; Lenses; Measurement by laser beam; Switches; X-ray lasers; Diffraction; X-ray; X-ray absorption near-edge spectroscopy (XANES); streak camera; time resolved;

fLanguage

English

Journal_Title

Selected Topics in Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

1077-260X

Type

jour

DOI

10.1109/JSTQE.2011.2105464

Filename

5716654