• DocumentCode
    1454259
  • Title

    Characterisation, analysis and optical properties of nanostructure ZnO using the sol-gel method

  • Author

    Kashif, Mhair ; Al-Douri, Y. ; Hashim, U. ; Ali, Mohammed Ershad ; Ali, S.M.U. ; Willander, Magnus

  • Author_Institution
    Inst. of Nano Electron. Eng., Univ. Malaysia Perlis, Kangar, Malaysia
  • Volume
    7
  • Issue
    2
  • fYear
    2012
  • Firstpage
    163
  • Lastpage
    167
  • Abstract
    Nanostructure ZnO was grown on thin aluminium layer, deposited on silicon substrate using the sol-gel method. The surface morphologies of nanostructure ZnO at different precursor concentrations were studied using scanning electron microscopy. Raman spectroscopy suggested that nanorods started to grow along with nanoflakes at a precursor concentration of 50-mM and the density of the nanorods significantly increases when the concentration was raised to 75-mM. Raman spectra were intensified and red shifted with the increment of precursor concentration. Optical properties of refractive index and optical dielectric constant are investigated. The structural defects at lower level of precursor were probably due to the hypoxic environment, whereas the red shift of Raman spectra was due to the structural change of ZnO nanocrystals.
  • Keywords
    II-VI semiconductors; Raman spectra; nanofabrication; nanorods; permittivity; red shift; refractive index; scanning electron microscopy; semiconductor growth; sol-gel processing; surface morphology; wide band gap semiconductors; Al; Raman spectroscopy; Si; ZnO; hypoxic environment; nanofiakes; nanorods; nanostructured materials; optical dielectric constant; optical properties; red shift; refractive index; scanning electron microscopy; sol-gel method; structural defects; surface morphology;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2011.0681
  • Filename
    6156044