DocumentCode :
1454259
Title :
Characterisation, analysis and optical properties of nanostructure ZnO using the sol-gel method
Author :
Kashif, Mhair ; Al-Douri, Y. ; Hashim, U. ; Ali, Mohammed Ershad ; Ali, S.M.U. ; Willander, Magnus
Author_Institution :
Inst. of Nano Electron. Eng., Univ. Malaysia Perlis, Kangar, Malaysia
Volume :
7
Issue :
2
fYear :
2012
Firstpage :
163
Lastpage :
167
Abstract :
Nanostructure ZnO was grown on thin aluminium layer, deposited on silicon substrate using the sol-gel method. The surface morphologies of nanostructure ZnO at different precursor concentrations were studied using scanning electron microscopy. Raman spectroscopy suggested that nanorods started to grow along with nanoflakes at a precursor concentration of 50-mM and the density of the nanorods significantly increases when the concentration was raised to 75-mM. Raman spectra were intensified and red shifted with the increment of precursor concentration. Optical properties of refractive index and optical dielectric constant are investigated. The structural defects at lower level of precursor were probably due to the hypoxic environment, whereas the red shift of Raman spectra was due to the structural change of ZnO nanocrystals.
Keywords :
II-VI semiconductors; Raman spectra; nanofabrication; nanorods; permittivity; red shift; refractive index; scanning electron microscopy; semiconductor growth; sol-gel processing; surface morphology; wide band gap semiconductors; Al; Raman spectroscopy; Si; ZnO; hypoxic environment; nanofiakes; nanorods; nanostructured materials; optical dielectric constant; optical properties; red shift; refractive index; scanning electron microscopy; sol-gel method; structural defects; surface morphology;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2011.0681
Filename :
6156044
Link To Document :
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