DocumentCode
1454259
Title
Characterisation, analysis and optical properties of nanostructure ZnO using the sol-gel method
Author
Kashif, Mhair ; Al-Douri, Y. ; Hashim, U. ; Ali, Mohammed Ershad ; Ali, S.M.U. ; Willander, Magnus
Author_Institution
Inst. of Nano Electron. Eng., Univ. Malaysia Perlis, Kangar, Malaysia
Volume
7
Issue
2
fYear
2012
Firstpage
163
Lastpage
167
Abstract
Nanostructure ZnO was grown on thin aluminium layer, deposited on silicon substrate using the sol-gel method. The surface morphologies of nanostructure ZnO at different precursor concentrations were studied using scanning electron microscopy. Raman spectroscopy suggested that nanorods started to grow along with nanoflakes at a precursor concentration of 50-mM and the density of the nanorods significantly increases when the concentration was raised to 75-mM. Raman spectra were intensified and red shifted with the increment of precursor concentration. Optical properties of refractive index and optical dielectric constant are investigated. The structural defects at lower level of precursor were probably due to the hypoxic environment, whereas the red shift of Raman spectra was due to the structural change of ZnO nanocrystals.
Keywords
II-VI semiconductors; Raman spectra; nanofabrication; nanorods; permittivity; red shift; refractive index; scanning electron microscopy; semiconductor growth; sol-gel processing; surface morphology; wide band gap semiconductors; Al; Raman spectroscopy; Si; ZnO; hypoxic environment; nanofiakes; nanorods; nanostructured materials; optical dielectric constant; optical properties; red shift; refractive index; scanning electron microscopy; sol-gel method; structural defects; surface morphology;
fLanguage
English
Journal_Title
Micro & Nano Letters, IET
Publisher
iet
ISSN
1750-0443
Type
jour
DOI
10.1049/mnl.2011.0681
Filename
6156044
Link To Document