• DocumentCode
    1454360
  • Title

    Optimal and near-optimal test sequencing algorithms with realistic test models

  • Author

    Raghavan, Vijaya ; Shakeri, Mojdeh ; Pattipati, Krishna

  • Author_Institution
    Mathworks Inc., Natick, MA, USA
  • Volume
    29
  • Issue
    1
  • fYear
    1999
  • fDate
    1/1/1999 12:00:00 AM
  • Firstpage
    11
  • Lastpage
    26
  • Abstract
    In this paper, we first present the formulation and solution of the basic test sequencing problem. We then consider generalized test sequencing problems that incorporate various practical features such as precedence constraints and setup operations for tests, multi-outcome tests, modular diagnosis, and rectification. We develop various AO* and information heuristic-based algorithms to solve these practical test sequencing problems. We also discuss the issues involved in implementation of the test sequencing algorithms for solving large problems efficiently, and show that our preprocessing techniques result in considerable speed-ups
  • Keywords
    fault diagnosis; heuristic programming; optimisation; testing; AO* algorithms; information heuristic-based algorithms; modular diagnosis; multi-outcome tests; near-optimal test sequencing algorithms; precedence constraints; preprocessing techniques; rectification; setup operations; test models; Aerospace electronics; Aircraft; Artificial satellites; Costs; Engines; Fault diagnosis; Heuristic algorithms; Performance evaluation; Software testing; System testing;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4427
  • Type

    jour

  • DOI
    10.1109/3468.736357
  • Filename
    736357