Dielectric loaded HTS resonators as frequency standards and low-phase noise oscillators

Author

Gallop, John C. ; Langham, Conway D. ; Hao, Ling ; Abbas, Farhat

Author_Institution

Nat. Phys. Lab., Teddington, UK

Volume

46

Issue

2

fYear

1997

fDate

4/1/1997 12:00:00 AM

Firstpage

122

Lastpage

125

Abstract

High-quality, high-temperature superconducting (HTS) thin-films exhibit very low losses at microwave frequencies and, as a result, allow very high Q resonators to be produced. The size of such resonators may be significantly reduced by loading with low-loss single crystal dielectric. The potential for HTS dielectric loaded resonators as practical frequency standards and reference elements for low-phase-noise oscillators is assessed, with emphasis on operation at 60 K, a temperature readily attainable with compact Stirling cycle coolers

Keywords

barium compounds; dielectric resonator oscillators; frequency measurement; high-temperature superconductors; low-temperature techniques; measurement standards; microwave measurement; superconducting cavity resonators; superconducting thin films; yttrium compounds; 60 K; HTS dielectric loaded resonators; Stirling cycle coolers; YBaCuO; dielectric loaded HTS resonators; frequency standards; high Q resonators; high-temperature superconducting thin-films; loading; low-loss single crystal dielectric; low-phase noise oscillators; low-phase-noise oscillators; microwave frequencies; reference elements; Dielectrics; High temperature superconductors; Microwave frequencies; Microwave oscillators; Resonant frequency; Superconducting device noise; Superconducting microwave devices; Superconducting transition temperature; Superconductivity; Surface impedance;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.571789

Filename

571789