• DocumentCode
    1455332
  • Title

    The SEU figure of merit and proton upset rate calculations

  • Author

    Petersen, E.L.

  • Author_Institution
    9502 Babson Ct., Fairfax, VA, USA
  • Volume
    45
  • Issue
    6
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    2550
  • Lastpage
    2562
  • Abstract
    This paper re-examines the use of the SEU Figure of Merit for heavy ion upset rate predictions. Slightly different orbit dependent rate coefficients are used for unhardened and hardened parts. The two different coefficients allow for the slight changes of LET spectra that occur due to the Earth´s magnetic shielding. Accurate heavy ion predictions can be made for any orbit and any part. We show that the Figure of Merit can also be used to predict upset rate due to protons in the proton radiation belt. A proton rate coefficient is introduced to describe the upset likelihood in orbits with proton exposures. These results mean that a part susceptibility can be described by a single parameter, rather than the four Weibull parameters and two Bendel parameters used previously. The Figure of Merit completely describes a part´s SEU susceptibility and can be obtained from either proton or heavy ion measurements, eliminating the expense of making both types of experiment. The total upset rate for a part in a particular orbit can be calculated using its characteristic Figure of Merit and a single orbit specific rate coefficient, the sum of the heavy ion and proton rate coefficients
  • Keywords
    ion beam effects; proton effects; radiation hardening (electronics); Earth orbit; LET spectra; SEU figure of merit; heavy ion upset rate; magnetic shielding; proton upset rate; radiation hardening; Belts; Extraterrestrial measurements; Least squares approximation; Low earth orbit satellites; Magnetic shielding; Magneto electrical resistivity imaging technique; Orbital calculations; Protons; Shape; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.736497
  • Filename
    736497