DocumentCode :
1455456
Title :
Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)
Author :
Pease, Ronald L. ; Gehlhausen, Mark ; Krieg, Jeff ; Titus, Jeff ; Turflinger, Tom ; Emily, Dave ; Coh, Lew
Author_Institution :
RLP Res., Albuquerque, NM, USA
Volume :
45
Issue :
6
fYear :
1998
fDate :
12/1/1998 12:00:00 AM
Firstpage :
2665
Lastpage :
2672
Abstract :
Data are presented on several low dose rate sensitive bipolar linear circuits to evaluate a proposed hardness assurance method. The circuits include primarily operational amplifiers and voltage comparators with a variety of sensitive components and failure modes. The proposed method, presented in 1997, includes an option between a low dose rate test at 10 mrd(Si)/s and room temperature and a 100°C elevated temperature irradiation test at a moderate dose rate. The results of this evaluation demonstrate that a 10 mrd(Si)is test is able (in ail but one case) to bound the worst case response within a factor of 2. For the moderate dose rate, 100°C test the worst case response is within a factor of 3 for 8 of 11 circuits, and for some circuits overpredicts the low dose rate response. The irradiation bias used for these tests often represents a more degrading bias condition than would be encountered in a typical space system application
Keywords :
bipolar analogue integrated circuits; comparators (circuits); integrated circuit testing; operational amplifiers; radiation hardening (electronics); bipolar linear circuit; elevated temperature irradiation; enhanced low dose rate sensitivity; failure mode; hardness assurance testing; operational amplifier; space system; voltage comparator; Annealing; Circuit testing; Cranes; Linear circuits; Operational amplifiers; Packaging; Performance evaluation; Regulators; Temperature sensors; Threshold voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.736512
Filename :
736512
Link To Document :
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