Irradiated integrated circuits dose-attenuation mapping using optically stimulated phosphors for packaging dosimetry

Author

Dusseau, L. ; Polge, G. ; Albert, L. ; Magnac, Y. ; Bessiere, J.C. ; Fesquet, J. ; Gasiot, J.

Author_Institution

Centre d´´Electron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France

Volume

45

Issue

6

fYear

1998

fDate

12/1/1998 12:00:00 AM

Firstpage

2695

Lastpage

2699

Abstract

The feasibility of a dose mapping system using optically stimulated luminescent (OSL) phosphors is demonstrated. The OSL technique is briefly reviewed as well as its interest for calculation code calibration. The sensors and the reading apparatus are presented. An example of attenuation dose map obtained for a dual in line plastic package (DIL) is given and the results compared to calculations with the code EGS4 PRESTA. Results obtained by experiment and simulation are discussed as well as the potentialities of the method

Keywords

dosimetry; integrated circuit packaging; integrated circuit reliability; phosphors; plastic packaging; radiation effects; EGS4 PRESTA; attenuation dose map; calculation code calibration; dose-attenuation mapping; dual in line plastic package; irradiated ICs; optically stimulated phosphors; packaging dosimetry; Dosimetry; Electronics packaging; Integrated optics; Optical attenuators; Optical films; Optical sensors; Phosphors; Photonic integrated circuits; Semiconductor device packaging; Stimulated emission;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.736517

Filename

736517