Title :
Charge collection and radiation hardness of a SOI microdosimeter for medical and space applications
Author :
Bradley, P.D. ; Rosenfeld, A.B. ; Lee, K.K. ; Jamieson, D.N. ; Heiser, G. ; Satoh, S.
Author_Institution :
Dept. of Eng. Phys., Wollongong Univ., NSW, Australia
fDate :
12/1/1998 12:00:00 AM
Abstract :
The first results obtained using a SOI device for microdosimetry applications are presented. Microbeam and broadbeam spectroscopy methods are used for determining minority carrier lifetime and radiation damage constants. A spectroscopy model is presented which includes the majority of effects that impact spectral resolution. Charge collection statistics were found to substantially affect spectral resolution. Lateral diffusion effects significantly complicate charge collection
Keywords :
carrier lifetime; diffusion; dosimeters; minority carriers; radiation hardening (electronics); silicon-on-insulator; SOI microdosimeter; broadbeam spectroscopy methods; charge collection; lateral diffusion effects; medical applications; microbeam spectroscopy; minority carrier lifetime; radiation damage constants; radiation hardness; space applications; spectral resolution; spectroscopy model; Application software; Biomedical engineering; Charge carrier lifetime; Diodes; Physics; Radiation detectors; Silicon; Space charge; Spectroscopy; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
