DocumentCode :
14555
Title :
Offset error reduction using gate-bulk-driven error correction amplifier for low-voltage sub-bandgap reference
Author :
Li Lu ; Changzhi Li
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Tech Univ., Lubbock, TX, USA
Volume :
49
Issue :
11
fYear :
2013
fDate :
May 23 2013
Firstpage :
694
Lastpage :
696
Abstract :
Presented is a gain-boosted gate-bulk-driven error correction amplifier with reduced offset errors for low-voltage sub-bandgap reference designs. The method can be applied to sub-bandgap circuits with BJT diodes, subthreshold MOSFETs or Schottky barrier diodes. Detailed analysis and circuit implementation are presented. Low voltage operation has been verified over - 55 to 125 °C. Simulation and measurement results demonstrate the minimised offset error and improved supply sensitivity, which indicates the effectiveness of the proposed gain boosting mechanism.
Keywords :
MOSFET; Schottky barriers; amplifiers; bipolar transistors; energy gap; error correction; error statistics; low-power electronics; semiconductor diodes; BJT diodes; Schottky barrier diodes; circuit implementation; detailed analysis; gain boosting mechanism; gain-boosted gate-bulk-driven error correction amplifier; low voltage operation; low-voltage sub-bandgap reference designs; minimised offset error; offset error reduction; reduced offset errors; sub-bandgap circuits; subthreshold MOSFET; supply sensitivity;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2013.0765
Filename :
6548175
Link To Document :
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