Ten-volt Josephson voltage standard at the ETL

Author

Murayama, Yasushi ; Sakuraba, Toshiaki ; Sakamoto, Yasuhiko ; Iwasa, Akio ; Yoshida, Haruo ; Kozakai, Tsuneoki ; Endo, Tadashi

Author_Institution

Electrotech. Lab., Ibaraki, Japan

Volume

46

Issue

2

fYear

1997

fDate

4/1/1997 12:00:00 AM

Firstpage

233

Lastpage

236

Abstract

A voltage standard system using a 10 V Josephson junction array has been developed. The uncertainty is 0.6×10^-8 for measurement of the 10 V output of a Zener diode reference standard. A comparison of the 10 V array system with the conventional 10 V measurement system composed of a 1 V array and a voltage divider was performed through measurements of a 10 V output of a Zener. The result agreed within the uncertainty (2×10^-8) of the comparison. The 10 V output voltages of a Zener reference standard are measured consecutively by the 10 V array system

Keywords

calibration; measurement errors; measurement standards; superconductor-insulator-superconductor devices; voltage measurement; 10 V; ETL; Electrotechnical Laboratory; Josephson junction array; Josephson voltage standard; Nb-AlO-Nb; Nb/AlO_x/Nb junctions; Zener diode reference standard; uncertainty; voltage standard system; Calibration; Diodes; Josephson junctions; Laboratories; Millimeter wave measurements; Millimeter wave technology; Pollution measurement; Semiconductor device measurement; Standards development; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.571820

Filename

571820