Title :
Possible role for secondary particles in proton-induced single event upsets of modern devices
Author :
Savage, M.W. ; McNulty, P.J. ; Roth, D.R. ; Foster, C.C.
Author_Institution :
Dept. of Phys., Clemson Univ., SC, USA
fDate :
12/1/1998 12:00:00 AM
Abstract :
Increases in the SEU sensitivity of some modern COTS devices suggest that other reactions besides the direct spallation reaction may begin to play a role in proton SEU events, but only in devices with upset thresholds significantly lower than devices currently flown in space or sold commercially for terrestrial applications. Triple coincidence tagged proton exposures and neutron exposures are combined to demonstrate these reactions in the same device
Keywords :
integrated circuit packaging; neutron effects; proton effects; space vehicle electronics; COTS devices; SEU sensitivity; neutron exposures; proton-induced single event upsets; secondary particles; space vehicle electronics; triple coincidence tagged proton exposures; upset thresholds; Arm; Detectors; Laboratories; Neutrons; Packaging; Particle scattering; Physics; Protons; Single event transient; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
