Title :
Dose-depth and SEU monitors for the STRV-1c satellite
Author :
Thomson ; Hartshorn, A. ; Brown, M. ; Adams, L. ; Nickson, R. ; Ng, A. ; Cousins, T. ; Jones, T.
Author_Institution :
Thomson & Nielsen Electron. Ltd., Nepean, Ont., Canada
fDate :
12/1/1998 12:00:00 AM
Abstract :
Small, low power instruments have been developed to monitor total-dose and single event upsets (SEUs) in spaceborne electronics. These instruments have been designed to act as continuous monitors on the Science and Technology Research Vehicle (STRV) satellite. They will also act as monitors for other spacecraft in orbits where total dose, single event upsets (SEUs) and other single event effects (SEEs) are considered a significant hazard to on-board electronics. Flight Models of each instrument have been designed and built to interface with the satellite on-board computer. The instruments have been characterized over the total dose range of 100 rads to 100 krads and the proton energy range 10 MeV to 500 MeV. The proton SEU cross section of 2×10-11 cm2/bit is orders of magnitude more sensitive to protons than current flight electronics components. These instruments will be flown on the STRV-1c satellite in a Geosynchronous Transfer Orbit (GTO)
Keywords :
artificial satellites; proton effects; radiation monitoring; space vehicle electronics; 10 to 500 MeV; 100 rad to 100 krad; SEU monitor; STRV-1c satellite; flight model; geosynchronous transfer orbit; low power instrument; proton SEU cross section; single event effect; single event upset; spaceborne electronics; spacecraft; total dose depth monitor; Aerospace electronics; Computer displays; Hazards; Instruments; Orbits; Protons; Satellites; Single event upset; Space technology; Space vehicles;
Journal_Title :
Nuclear Science, IEEE Transactions on