Title :
Anatomy of an in-flight anomaly: investigation of proton-induced SEE test results for stacked IBM DRAMs
Author :
LaBel, K.A. ; Marshall, P.W. ; Barth, J.L. ; Katz, R.B. ; Reed, R.A. ; Leidecker, H.W. ; Kim, H.S. ; Marshall, C.J.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fDate :
12/1/1998 12:00:00 AM
Abstract :
We present ground test and space flight data describing a single event anomaly that affects multiple bytes in a stacked DRAM module. A 12 Gbit solid state recorder containing 1,440 DRAM die experiences the anomalous events at a rate requiring testing of a large sample set of these modules
Keywords :
DRAM chips; integrated circuit testing; modules; proton effects; space vehicle electronics; 12 Gbit; dynamic RAM; ground test data; in-flight anomaly; multiple bytes; proton-induced SEE test results; single event anomaly; single event effects; solid state recorder; space flight data; stacked DRAM module; stacked IBM DRAMs; Aerospace engineering; Anatomy; Cosmic rays; Encoding; Error correction; Error correction codes; Random access memory; Single event upset; Solid state circuits; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
